Orientation-dependent dielectric properties of Ba(Sn0.15Ti0.85)O3 thin films prepared by sol-gel method

Journal of Physics and Chemistry of Solids

Volumn 70, Issue 8, 2009, Pages 1213-1217

  Song, Sannian ^a,b   Zhai, Jiwei ^a   Gao, Lina ^a   Yao, Xi ^a  

^a TONGJI UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

A. Thin films; C. X ray diffraction; D. Dielectric properties

Indexed keywords

A. THIN FILMS; APPLIED ELECTRIC FIELD; BARIUM STANNATE TITANATE; C. X-RAY DIFFRACTION; D. DIELECTRIC PROPERTIES; HIGH TUNABILITY; IN-PLANE; IN-PLANE DIRECTION; INTER-DIGITAL CAPACITORS; NONLINEAR DIELECTRIC PROPERTIES; RANDOM ORIENTATIONS; SINGLE-CRYSTAL SUBSTRATES; SOL-GEL METHODS; TUNABLE MICROWAVE DEVICES;

BARIUM; BARIUM TITANATE; CERAMIC CAPACITORS; DIFFRACTION; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; GELATION; GELS; MICROWAVE DEVICES; MICROWAVES; SOL-GEL PROCESS; SOL-GELS; SOLS; THIN FILMS; TIN; X RAY DIFFRACTION;

DIELECTRIC PROPERTIES;

EID: 68049120172     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2009.07.007     Document Type: Article

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