Enhanced dark field microscopy for rapid artifact-free detection of nanoparticle binding to Candida albicans cells and hyphae

Biotechnology Journal

Volumn 4, Issue 6, 2009, Pages 871-879

  Weinkauf, Heidi ^a   Brehm Stecher, Byron F ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

Antifungal; Candida albicans; Dark field microscopy; Metal nanoparticles; Resonant light scattering

Indexed keywords

ANTIFUNGAL; CANDIDA ALBICANS; DARK FIELD MICROSCOPY; METAL NANOPARTICLES; RESONANT LIGHT SCATTERING;

CATALYST ACTIVITY; CELL MEMBRANES; LIGHT SCATTERING; NANOPARTICLES; REFRACTION; SCANNING ELECTRON MICROSCOPY; SCATTERING;

METALS;

COBALT; COPPER; IRON; MANGANESE; METAL NANOPARTICLE; NICKEL; PALLADIUM; SILVER;

ANTIFUNGAL ACTIVITY; ARTICLE; ARTIFACT; BROTH DILUTION; CANDIDA ALBICANS; CELL INTERACTION; CONTROLLED STUDY; DARK FIELD MICROSCOPY; DIGITAL IMAGING; DRUG EFFICACY; DRUG SCREENING; FUNGUS HYPHAE; ILLUMINATION; LIGHT SCATTERING; LIQUID CULTURE; METAL BINDING; MICROSCOPE; MICROSCOPY; MINIMUM INHIBITORY CONCENTRATION; NONHUMAN; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

ALLOYS; ANTIFUNGAL AGENTS; ARTIFACTS; CANDIDA ALBICANS; HYPHAE; IMAGE PROCESSING, COMPUTER-ASSISTED; LIGHT; METAL NANOPARTICLES; METALS, HEAVY; MICROBIAL SENSITIVITY TESTS; MICROSCOPY; MICROSCOPY, ELECTRON, SCANNING; SCATTERING, RADIATION; SURFACE PLASMON RESONANCE;

CANDIDA; CANDIDA ALBICANS;

EID: 68049095882     PISSN: 18606768     EISSN: 18607314     Source Type: Journal    
DOI: 10.1002/biot.200800358     Document Type: Article

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