CuInS2 thin films grown sequentially from binary sulfides as compared to layers evaporated directly from the elements

Semiconductor Science and Technology

Volumn 21, Issue 5, 2006, Pages 709-712

  Guillen C ^a  

^a CIEMAT   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; EVAPORATION; MORPHOLOGY; OPTICAL PROPERTIES; RAPID THERMAL ANNEALING; SULFUR COMPOUNDS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

BINARY SULFIDES; CHEMICAL CHARACTERISTICS; SUBSTRATE TEMPERATURE;

THIN FILMS;

EID: 33645670902     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/5/025     Document Type: Article

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