Simplified approach to diffraction tomography in optical microscopy

Optics Express

Volumn 17, Issue 15, 2009, Pages 12407-12417

  Fiolka, Reto ^a   Wicker, Kai ^b   Heintzmann, Rainer ^b   Stemmer, Andreas ^a  

^a ETH ZURICH   (Switzerland)

^b KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; IMAGE RECONSTRUCTION; MECHANICAL STABILITY;

COMMON-PATH INTERFEROMETERS; DIFFRACTION TOMOGRAPHY; EXTRACTION ALGORITHMS; FIRST ORDER BORN APPROXIMATIONS; MICROSCOPIC OBJECTS; MICROSCOPY TECHNIQUE; SCATTERING DENSITY; TOMOGRAPHIC METHODS;

TOMOGRAPHY;

GREEN FLUORESCENT PROTEIN;

ALGORITHM; ARTICLE; CHEEK; CHEMISTRY; EQUIPMENT DESIGN; FOURIER ANALYSIS; HUMAN; IMAGE PROCESSING; INTERFEROMETRY; METHODOLOGY; MICROSCOPY; OPTICS; PATHOLOGY; RADIATION SCATTERING; STATISTICAL MODEL; THREE DIMENSIONAL IMAGING; TOMOGRAPHY;

ALGORITHMS; CHEEK; EQUIPMENT DESIGN; FOURIER ANALYSIS; GREEN FLUORESCENT PROTEINS; HUMANS; IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; INTERFEROMETRY; MICROSCOPY; MODELS, STATISTICAL; OPTICS AND PHOTONICS; SCATTERING, RADIATION; TOMOGRAPHY;

EID: 67749127534     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.012407     Document Type: Article

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