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Volumn 131, Issue 6, 2009, Pages 2102-2103
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Monolayer resist for patterned contact printing of aligned nanowire arrays
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL INTERACTIONS;
CONTACT PRINTING;
LIGHT PATTERNS;
MOLECULAR MONOLAYER;
NANO SCALE;
NANOWIRE ARRAYS;
OXYGEN-RICH ENVIRONMENT;
RESIST LAYERS;
SINGLE-STEP PROCESS;
ELECTRIC WIRE;
NANOWIRES;
OXYGEN;
PRINTING;
SELF ASSEMBLED MONOLAYERS;
ELECTRON ENERGY LEVELS;
GERMANIUM;
NANOWIRE;
SELF ASSEMBLED MONOLAYER;
SILICON DIOXIDE;
ARTICLE;
CHEMICAL BOND;
CHEMICAL INTERACTION;
CHEMICAL MODIFICATION;
CHEMICAL REACTION;
CONTACT ANGLE;
ELLIPSOMETRY;
NANOARRAY;
NANOFABRICATION;
SCANNING ELECTRON MICROSCOPY;
TECHNIQUE;
ULTRAVIOLET RADIATION;
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EID: 67749089297
PISSN: 00027863
EISSN: None
Source Type: Journal
DOI: 10.1021/ja8099954 Document Type: Article |
Times cited : (71)
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References (14)
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