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Volumn 117, Issue 2-3, 2009, Pages 465-470
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Investigation of SR method grown 〈0 0 1〉 directed KDP single crystal and its characterization by high-resolution X-ray diffractometry (HRXRD), laser damage threshold, dielectric, thermal analysis, optical and hardness studies
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Author keywords
Crystal growth; Crystal symmetry; Hardness; Optical materials
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Indexed keywords
CONVENTIONAL METHODS;
CRYSTAL DIAMETER;
CRYSTAL THICKNESS;
CRYSTALLINE PERFECTION;
DAMAGE THRESHOLD;
DIELECTRIC CONSTANTS;
DIHYDROGEN;
GROWN CRYSTALS;
HARDNESS VALUES;
HIGH-RESOLUTION X-RAY DIFFRACTOMETRY;
HRXRD;
INNER DIAMETERS;
KDP CRYSTALS;
LASER DAMAGE THRESHOLD;
ND:GLASS LASER;
SEED CRYSTAL;
THERMAL ANALYSIS;
UV-VIS SPECTROSCOPY;
CERAMIC CAPACITORS;
CRYSTAL GROWTH;
CRYSTALLIZATION;
DIELECTRIC LOSSES;
DIFFRACTION;
DIFFRACTOMETERS;
GRAIN BOUNDARIES;
HARDNESS;
LASER DAMAGE;
LASERS;
NEODYMIUM LASERS;
OPTICAL MATERIALS;
POTASSIUM;
SINGLE CRYSTALS;
STRAIN MEASUREMENT;
THERMOANALYSIS;
ULTRAVIOLET SPECTROSCOPY;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
CRYSTAL SYMMETRY;
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EID: 67651230189
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matchemphys.2009.06.021 Document Type: Article |
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Times cited : (27)
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References (25)
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