Microhardness studies of GaTe whiskers

Crystal Research and Technology

Volumn 40, Issue 8, 2005, Pages 782-785

  Kunjomana, A G ^a   Chandrasekharan, K A ^a  

^a CHRIST DEEMED TO BE UNIVERSITY   (India)

Author keywords

Crack propagation; GaTe; Physical vapour deposition (PVD); Vickers microhardness; Whiskers

Indexed keywords

CRACK PROPAGATION; CRYSTAL WHISKERS; INDENTATION; MICROHARDNESS; PHYSICAL VAPOR DEPOSITION; SINGLE CRYSTALS; STRAIN HARDENING; VICKERS HARDNESS TESTING;

GATE; MICROINDENTATION; VICKERS MICROHARDNESS; WHISKERS;

GALLIUM COMPOUNDS;

EID: 25444526628     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.200410431     Document Type: Article

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