Research on reliability grading acceleration test of Pt film temperature sensor

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 30, Issue 6, 2009, Pages 1129-1133

  Guo, Jianying ^a   Ding, Xibo ^a   Sun, Yongquan ^a   Liu, Xinhua ^a  

^a HARBIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Failure rate; Pt film temperature sensor; Reliability grading test; The accelerate life test

Indexed keywords

ACCELERATION TESTS; ARRHENIUS ACCELERATION; ELECTRONIC COMPONENT; FAILURE MECHANISM; FAILURE RATE; LIFE-TEST; NUMBER OF SAMPLES; PRACTICAL ENGINEERING; PT FILM TEMPERATURE SENSOR; PT FILMS; SENSOR TESTS; TEST TIME; THE ACCELERATE LIFE TEST;

FAILURE ANALYSIS; GRADING; PLATINUM; QUALITY ASSURANCE; SAFETY ENGINEERING; TEMPERATURE SENSORS;

TESTING;

EID: 67651173090     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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