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Volumn , Issue , 2006, Pages 313-317

Accelerated life tests at higher usage rates: A case study

Author keywords

Accelerated life test; Arrhenius relationship; Best compromise test plan; Cycles to failure; Switching rate; Usage; Weibull distribution

Indexed keywords

ACCELERATED LIFE TEST; ARRHENIUS RELATIONSHIP; BEST COMPROMISE TEST PLAN; CYCLES TO FAILURE; SWITCHING RATE;

EID: 34250195754     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2006.1677393     Document Type: Conference Paper
Times cited : (15)

References (5)
  • 1
    • 15544376231 scopus 로고    scopus 로고
    • Accelerated life tests at higher usage rates
    • G. Yang, "Accelerated life tests at higher usage rates," IEEE Transactions on Reliability, vol. 54, no. 1, 2005, pp53-57.
    • (2005) IEEE Transactions on Reliability , vol.54 , Issue.1 , pp. 53-57
    • Yang, G.1
  • 2
    • 22444440839 scopus 로고    scopus 로고
    • A bibliography of accelerated test plans
    • W. B. Nelson, "A bibliography of accelerated test plans," IEEE Transactions on Reliability, vol. 54, no. 2, 2005, pp194-197.
    • (2005) IEEE Transactions on Reliability , vol.54 , Issue.2 , pp. 194-197
    • Nelson, W.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.