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Volumn , Issue , 2006, Pages 313-317
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Accelerated life tests at higher usage rates: A case study
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Author keywords
Accelerated life test; Arrhenius relationship; Best compromise test plan; Cycles to failure; Switching rate; Usage; Weibull distribution
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Indexed keywords
ACCELERATED LIFE TEST;
ARRHENIUS RELATIONSHIP;
BEST COMPROMISE TEST PLAN;
CYCLES TO FAILURE;
SWITCHING RATE;
LIFE CYCLE;
MATHEMATICAL MODELS;
MAXIMUM LIKELIHOOD;
RELIABILITY THEORY;
WEIBULL DISTRIBUTION;
PRODUCT DEVELOPMENT;
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EID: 34250195754
PISSN: 0149144X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/RAMS.2006.1677393 Document Type: Conference Paper |
Times cited : (15)
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References (5)
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