Reliability analysis of an interrogation instrument for optical fiber Bragg grating sensing

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 29, Issue 4, 2008, Pages 673-678

  Zhu, Pingyu ^a,b   Dhillon, B S ^b   Li, Xuejun ^a   Bin, Guangfu ^a  

^a HUNAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b UNIVERSITY OF OTTAWA   (Canada)

Author keywords

Fault tree; Fiber Bragg grating; Optical fiber sensor; Reliability analysis

Indexed keywords

EID: 42549159044     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)