Portable multi-anvil device for in situ angle-dispersive synchrotron diffraction measurements at high pressure and temperature

Journal of Synchrotron Radiation

Volumn 16, Issue 4, 2009, Pages 513-523

  Le Godec, Yann ^a   Hamel, Gérard ^a   Solozhenko, Vladimir L ^b   Martinez Garcia, Domingo ^c   Philippe, Julien ^a   Hammouda, Tahar ^d   Mezouar, Mohamed ^e   Crichton, Wilson A ^e   Morard, Guillaume ^e   Klotz, Stefan ^a  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^b UNIVERSITÉ PARIS 13   (France)

^c UNIVERSITY OF VALENCIA   (Spain)

^d UNIVERSITÉ CLERMONT AUVERGNE   (France)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Angle dispersive X ray diffraction; High pressure; High temperature; Multi anvil system

Indexed keywords

ANGLE-DISPERSIVE X-RAY DIFFRACTION; ANVIL CELLS; CRYSTALLOGRAPHIC STUDIES; HIGH PRESSURE; HIGH TEMPERATURE; IN-SITU; IN-SITU MEASUREMENT; MULTI-ANVIL SYSTEM; SYNCHROTRON DIFFRACTION; SYNCHROTRON DIFFRACTION STUDY; SYNCHROTRON RADIATION FACILITY; TECHNICAL DEVELOPMENT; TOTAL MASS;

DIFFRACTION; SINGLE CRYSTALS; SYNCHROTRONS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

TOOLS;

EID: 67651151149     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049509012928     Document Type: Article

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