Large exchange bias IrMn/CoFe for magnetic tunnel junctions

IEEE Transactions on Magnetics

Volumn 44, Issue 11 PART 1, 2008, Pages 2824-2827

  Fernandez Outon, Luis E ^a   O'Grady, Kevin ^a   Oh, Sangmun ^b   Zhou, Min ^b   Pakala, Mahendra ^b  

^a UNIVERSITY OF YORK   (United Kingdom)

^b WESTERN DIGITAL CORPORATION   (United States)

Author keywords

Blocking temperature; Exchange bias; Interfacial coupling; Thermal activation

Indexed keywords

EID: 67651117555     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2001495     Document Type: Article

References (18)

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