Spraying spin coating silanization at room temperature of a SiO2 surface for silicon-based integrated light emitters

Journal of Colloid and Interface Science

Volumn 337, Issue 2, 2009, Pages 375-380

  Cherkouk, C ^a   Rebohle, L ^a   Skorupa, W ^a   Strache, T ^a   Reuther, H ^a   Helm, M ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

APMS; Atomic force microscopy; Biosensors; Estrogen; Si based light emission; Silanization; Silanol; X ray photoelectron spectroscopy

Indexed keywords

APMS; ESTROGEN; SI-BASED LIGHT EMISSION; SILANIZATION; SILANOL;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; BIOSENSORS; COUPLING AGENTS; EMISSION SPECTROSCOPY; FLUORESCENCE; HYDRATES; INFRARED SPECTROSCOPY; LIGHT; LIGHT EMISSION; LIGHT SOURCES; PASSIVATION; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; RAMAN SPECTROSCOPY; SIGNAL TRANSDUCTION; SILANES; SILICON; SILICON OXIDES; SPECTROSCOPIC ANALYSIS; SPIN DYNAMICS;

X RAY PHOTOELECTRON SPECTROSCOPY;

BUFFER; DIETHYLENETRIAMINE; NITROGEN; SILANE DERIVATIVE; SILANOL; SILICON DIOXIDE; SULFONIC ACID DERIVATIVE;

ANALYTIC METHOD; ARTICLE; ATMOSPHERE; BIOSENSOR; CATALYSIS; CHEMICAL STRUCTURE; CONTROLLED STUDY; COVALENT BOND; FLUORESCENCE ANALYSIS; HYDROLYSIS; IN SITU HYBRIDIZATION; INFRARED SPECTROSCOPY; PRIORITY JOURNAL; PROCESS OPTIMIZATION; RAMAN SPECTROMETRY; ROOM TEMPERATURE; SPRAYING SPIN COATING; SURFACE PROPERTY; ULTRASOUND; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 67650986128     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2009.05.045     Document Type: Article

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