TEM foil preparation of sub-micrometre sized individual grains by focused ion beam technique

Journal of Microscopy

Volumn 235, Issue 1, 2009, Pages 59-66

  Holzapfel, C ^a,c   Soldera, F ^a   Vollmer, C ^b   Hoppe, P ^b   Mucklich F ^a  

^a SAARLAND UNIVERSITY   (Germany)

^b MAX PLANCK INSTITUTE FOR CHEMISTRY   (Germany)

^c Schleifring und Apparatebau GmbH   (Germany)

Author keywords

Focused ion beam; Presolar silicate grains; Target preparation; TEM foil preparation

Indexed keywords

ELECTRONS; FOCUSED ION BEAMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IONS; SCANNING ELECTRON MICROSCOPY;

CIRCUMSTELLAR; FOCUSED ION BEAM TECHNIQUE; FOCUSED IONS BEAMS; GALACTIC CHEMICAL EVOLUTIONS; INDIVIDUAL GRAINS; PRESOLAR SILICATE GRAIN; SUBMICROMETERS; TARGET PREPARATION; TEM FOIL PREPARATION; TEST MODELS;

SILICATES;

SILICATE;

ACCURACY; ARTICLE; FOIL; GRAIN; ISOTOPE ANALYSIS; NANOANALYSIS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 67650822402     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03181.x     Document Type: Article

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