A first principles study of the properties of Al:ZnO and its adhesion to Ag in an optical coating

Journal of Applied Physics

Volumn 106, Issue 1, 2009, Pages

  Lin, Zheshuai ^a,b   Bristowe, Paul D ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b TECHNICAL INSTITUTE OF PHYSICS AND CHEMISTRY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM INCORPORATION; AMBIENT CONDITIONS; CHEMICAL BONDINGS; DENSITY-FUNCTIONAL STUDY; FIRST-PRINCIPLE; FIRST-PRINCIPLES STUDY; GASEOUS ADSORPTION; HYDROGEN ADSORPTION; INTERFACIAL BONDING; INTERNAL STRESS; METAL/OXIDE INTERFACE; PROPERTIES OF AL; STRENGTHENING MECHANISMS; WEAKENING EFFECT; ZNO; ZNO LAYERS; ZNO SURFACE;

ADHESION; ALUMINA; ALUMINUM; CHEMICAL BONDS; GAS ADSORPTION; HYDROGEN; OPTICAL COATINGS; OPTICAL MATERIALS; OPTICAL PROPERTIES; SILVER; ZINC; ZINC OXIDE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 67650742263     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3159651     Document Type: Article

References (27)

1. H. J. Glaser, Large Area Glass Coating (Von Ardenne Anlagentechnik, Dresden, 2000).
2. Handbook of Optical Properties: Thin Films for Optical Coatings, edited by, R. E. Hummel, and, K. H. Guenther, (CRC, Boca Raton, FL, 1995), Vol. 1.
3. J. A. Ridealgh, Mater. Res. Soc. Symp. Proc. 0272-9172 890, 39 (2006).
4. M. Arbab, MRS Bull. 0883-7694 22, 27 (1997).
5. E. Ando and M. Miyazaki, Thin Solid Films 0040-6090 351, 308 (1999). 10.1016/S0040-6090(98)01796-9
6. M. Miyazaki and E. Ando, J. Non-Cryst. Solids 0022-3093 178, 245 (1994). 10.1016/0022-3093(94)90292-5
7. E. Ando, S. Suzuki, N. Aomine, M. Miysazaki, and M. Tada, Vacuum 0042-207X 59, 792 (2000). 10.1016/S0042-207X(00)00349-3
8. E. Ando and M. Miyazaki, Thin Solid Films 0040-6090 392, 289 (2001). 10.1016/S0040-6090(01)01045-8
9. M. C. Payne, M. P. Teter, D. C. Allan, T. A. Arias, and J. D. Joannopoulos, Rev. Mod. Phys. 0034-6861 64, 1045 (1992). 10.1103/RevModPhys.64. 1045
10. S. J. Clark, M. D. Segall, C. J. Pickard, P. J. Hasnip, M. J. Probert, K. Refson, and M. C. Payne, Z. Kristallogr. 0044-2968 220, 567 (2005). 10.1524/zkri.220.5.567.65075
11. D. Vanderbilt, Phys. Rev. B 0163-1829 41, 7892 (1990). 10.1103/PhysRevB.41.7892
12. J. P. Perdew, K. Burke, and M. Ernzerhof, Phys. Rev. Lett. 0031-9007 77, 3865 (1996). 10.1103/PhysRevLett.77.3865
13. Z. Lin and P. D. Bristowe, J. Appl. Phys. 0021-8979 102, 103513 (2007). 10.1063/1.2815646
14. Z. Lin and P. D. Bristowe, Phys. Rev. B 0163-1829 75, 205423 (2007). 10.1103/PhysRevB.75.205423
15. T. H. Fischer and J. Almlof, J. Phys. Chem. 0022-3654 96, 9768 (1992). 10.1021/j100203a036
16. M. Arbab, Thin Solid Films 0040-6090 381, 15 (2001). 10.1016/S0040- 6090(00)01341-9
17. B. Meyer, Phys. Rev. B 0163-1829 69, 045416 (2004). 10.1103/PhysRevB.69. 045416
18. K. C. Park, D. Y. Ma, and K. H. Kim, Thin Solid Films 0040-6090 305, 201 (1997). 10.1016/S0040-6090(97)00215-0
19. R. K. Shukla, A. Srivastava, A. Srivastava, and K. C. Dubey, J. Cryst. Growth 0022-0248 294, 427 (2006). 10.1016/j.jcrysgro.2006.06.035
20. S. J. Henley, M. N. R. Ashfold, and D. Cherns, Surf. Coat. Technol. 0257-8972 177-178, 271 (2004). 10.1016/j.surfcoat.2003.09.005
21. H. Kim, A. Pique, J. S. Horwitz, H. Murata, Z. H. Kafafi, C. M. Gilmore, and D. B. Chrisey, Thin Solid Films 0040-6090 377-378, 798 (2000). 10.1016/S0040-6090(00)01290-6
22. M. Chen, Z. L. Pei, C. Sun, L. S. Wen, and X. Wang, Mater. Lett. 0167-577X 48, 194 (2001). 10.1016/S0167-577X(00)00302-5
23. M. Kunat, St. Gil Girol, Th. Becker, U. Burghaus, and Ch. Woll, Phys. Rev. B 0163-1829 66, 081402 (2002). 10.1103/PhysRevB.66.081402
24. R. S. Mulliken, J. Chem. Phys. 0021-9606 23, 1833 (1955). 10.1063/1.1740588
25. M. W. Finnis, J. Phys.: Condens. Matter 0953-8984 8, 5811 (1996). 10.1088/0953-8984/8/32/003
26. T. Hong, J. R. Smith, and D. J. Srolovitz, Phys. Rev. B 0163-1829 47, 13615 (1993). 10.1103/PhysRevB.47.13615
27. J. R. Smith, T. Hong, and D. J. Srolovitz, Phys. Rev. Lett. 0031-9007 72, 4021 (1994). 10.1103/PhysRevLett.72.4021