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Volumn 2008, Issue 2, 2008, Pages

Scaling of temperature sensors for smart power MOSFETs

Author keywords

Smart power MOSFET; Temperature sensor; Thermal simulation

Indexed keywords

HIGH-POWER; MAXIMUM TEMPERATURE; OVERLOAD CONDITION; POWER APPLICATIONS; POWER MOSFET; PROTECTION CIRCUITS; SHORT CIRCUIT; SMART POWER; SMART POWER MOSFET; THERMAL SIMULATION;

EID: 67650552874     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ic:20080180     Document Type: Conference Paper
Times cited : (4)

References (15)
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    • Smorodin, T.1    Wilde, J.2    Alpern, P.3    Stecher, M.4
  • 4
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    • Impact of thermal overload operation on wirebond and metallization reliability in smart power devices, Proc
    • Glavanovics, M., Detzel, T., Weber, K., Impact of thermal overload operation on wirebond and metallization reliability in smart power devices, Proc. ESSDERC 2004, 2004, 273-276
    • (2004) ESSDERC 2004 , pp. 273-276
    • Glavanovics, M.1    Detzel, T.2    Weber, K.3
  • 5
    • 24144431798 scopus 로고    scopus 로고
    • Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation
    • Irace, A., Breglio, G., Spirito, P., Letor, R., Russo, S.: Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation, Microelectronics Reliability 45, 2005, 1706-1710
    • (2005) Microelectronics Reliability , vol.45 , pp. 1706-1710
    • Irace, A.1    Breglio, G.2    Spirito, P.3    Letor, R.4    Russo, S.5
  • 6
    • 34247538518 scopus 로고    scopus 로고
    • Fast transient infrared thermal analysis of smart Power MOSFETS in permanent short circuit operation
    • Breglio, G., Irace, A., Spirito, P., Letor, R., Russo, S.: Fast transient infrared thermal analysis of smart Power MOSFETS in permanent short circuit operation, Proc. ISPSD'06, 2006, 257-261
    • (2006) Proc. ISPSD'06 , pp. 257-261
    • Breglio, G.1    Irace, A.2    Spirito, P.3    Letor, R.4    Russo, S.5
  • 7
    • 0032598919 scopus 로고    scopus 로고
    • A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices
    • Furbock, C., Thalhammer, R., Litzenberger, M., Seliger, N., Pogany, D., Gornik, E., Wachutka, G.: A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices, Proc. ISPSD'99, 1999, 193-196
    • (1999) Proc. ISPSD'99 , pp. 193-196
    • Furbock, C.1    Thalhammer, R.2    Litzenberger, M.3    Seliger, N.4    Pogany, D.5    Gornik, E.6    Wachutka, G.7
  • 12
    • 84937111765 scopus 로고    scopus 로고
    • Measurement and Simulation of Self-heating in DMOS Transistors up to Very High Temperatures
    • Pfost, M., Joos, J., Stecher, M.: Measurement and Simulation of Self-heating in DMOS Transistors up to Very High Temperatures, Proc. ISPSD'08, 2008, 209-212
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    • Pfost, M.1    Joos, J.2    Stecher, M.3
  • 13
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    • Influence of inhomogeneous current distribution on the thermal SOA of integrated DMOS transistors
    • Denison, M., Pfost, M., Pieper, K.-W., Märkl, S., Metzner, D., Stecher, M.: Influence of inhomogeneous current distribution on the thermal SOA of integrated DMOS transistors, Proc. ISPSD'04, 2004, 409-412
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.