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Volumn , Issue , 2009, Pages

Induced delamination of silicon-molding compound interfaces

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN PROBLEMS; ELECTRONIC PACKAGING; EPOXY MOLDING COMPOUNDS; EXISTING METHOD; EXPERIMENTAL PROCEDURE; FINITE ELEMENT SIMULATIONS; INTERFACE FRACTURE; MECHANICS PROPERTY; MOLDING COMPOUND; PACKAGE FABRICATION; SILICON INTERFACE;

EID: 67650511916     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESIME.2009.4938478     Document Type: Conference Paper
Times cited : (9)

References (12)
  • 1
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    • Obtaining mode mixity for a bimaterial interface crack using the virtual crack closure technique
    • DOI 10.1007/s10704-006-0069-4
    • A. Agrawal and A.M. Karlsson. Obtaining mode mixity for a bimaterial interface crack using the virtual crack closure technique. International Journal of Fracture, 141:75-98, 2006. (Pubitemid 44869245)
    • (2006) International Journal of Fracture , vol.141 , Issue.1-2 , pp. 75-98
    • Agrawal, A.1    Karlsson, A.M.2
  • 3
    • 0000492651 scopus 로고    scopus 로고
    • Separation of crack extension modes in orthotropic delamination models
    • J.L. Beuth. Separation of crack extension modes in orthotropic delamination models. International Journal of Fracture, 77(4):305-321, 1996.
    • (1996) International Journal of Fracture , vol.77 , Issue.4 , pp. 305-321
    • Beuth, J.L.1
  • 4
    • 0041136638 scopus 로고
    • A mixed-mode bending apparatus for delamination testing
    • NAS 1.15:100662, NASA Langley Research Center, August
    • J.H. Crews and J.R. Reeder. A mixed-mode bending apparatus for delamination testing. NASA technical memorandum NAS 1.15:100662, NASA Langley Research Center, August 1988.
    • (1988) NASA Technical Memorandum
    • Crews, J.H.1    Reeder, J.R.2
  • 6
    • 67650568174 scopus 로고    scopus 로고
    • Embedded wafer level ball grid array (ewlb)
    • T. Meyer. Embedded wafer level ball grid array (ewlb). In SEMICON Europa, 2007.
    • (2007) Semicon Europa
    • Meyer, T.1
  • 7
    • 85087879410 scopus 로고
    • Plane problems of cracks in dissimilar materials
    • J.R. Rice and G.C. Sih. Plane problems of cracks in dissimilar materials. Journal of Applied Mechanics, 32(2):418-423, 1965.
    • (1965) Journal of Applied Mechanics , vol.32 , Issue.2 , pp. 418-423
    • Rice, J.R.1    Sih, G.C.2
  • 8
    • 0005160499 scopus 로고
    • Bruchvorhersagen bei überlagerter Normal-und Schubbeanspruchung von Rissen
    • H.A. Richard. Bruchvorhersagen bei überlagerter Normal-und Schubbeanspruchung von Rissen. VDI-Forschungsheft, 631/85:1-60, 1985.
    • (1985) VDI-Forschungsheft , vol.631 , Issue.85 , pp. 1-60
    • Richard, H.A.1
  • 9
    • 0017561766 scopus 로고
    • FINITE ELEMENT CALCULATION OF STRESS INTENSITY FACTORS BY A MODIFIED CRACK CLOSURE INTEGRAL.
    • DOI 10.1016/0013-7944(77)90013-3
    • E.F. Rybicki and M.F. Kanninen. A finite element calculation of stress intensity factors by a modified crack closure integral. Engineering Fracture Mechanics, 9(4):931-938, 1977. (Pubitemid 9388160)
    • (1977) Engineering Fracture Mechanics , vol.9 , Issue.4 , pp. 931-938
    • Rybicki, E.F.1    Kanninen, M.F.2
  • 11
    • 0037198099 scopus 로고    scopus 로고
    • Micro- and nanomaterials characterization by image correlation methods
    • DOI 10.1016/S0924-4247(01)00908-6, PII S0924424701009086
    • D. Vogel, A. Gollhardt, and B. Michel. Micro-and nanomaterials characterization by image correlation methods. Sensors and Actuators A: Physical, Volume 99, Issues 1-2, 30:165-171, 2002. (Pubitemid 34690214)
    • (2002) Sensors and Actuators, A: Physical , vol.99 , Issue.1-2 , pp. 165-171
    • Vogel, D.1    Gollhardt, A.2    Michel, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.