-
1
-
-
33845335515
-
Obtaining mode mixity for a bimaterial interface crack using the virtual crack closure technique
-
DOI 10.1007/s10704-006-0069-4
-
A. Agrawal and A.M. Karlsson. Obtaining mode mixity for a bimaterial interface crack using the virtual crack closure technique. International Journal of Fracture, 141:75-98, 2006. (Pubitemid 44869245)
-
(2006)
International Journal of Fracture
, vol.141
, Issue.1-2
, pp. 75-98
-
-
Agrawal, A.1
Karlsson, A.M.2
-
2
-
-
33745683894
-
Fracture mechanics based crack and delamination risk evaluation and rsm/doe concepts for advanced microelectronics applications
-
th. Int. Conf. on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, EuroSimE, 2005.
-
(2005)
th. Int. Conf. on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, Eurosime
-
-
Auersperg, J.1
Seiler, B.2
Cadalen, E.3
Dudek, R.4
Michel, B.5
-
3
-
-
0000492651
-
Separation of crack extension modes in orthotropic delamination models
-
J.L. Beuth. Separation of crack extension modes in orthotropic delamination models. International Journal of Fracture, 77(4):305-321, 1996.
-
(1996)
International Journal of Fracture
, vol.77
, Issue.4
, pp. 305-321
-
-
Beuth, J.L.1
-
4
-
-
0041136638
-
A mixed-mode bending apparatus for delamination testing
-
NAS 1.15:100662, NASA Langley Research Center, August
-
J.H. Crews and J.R. Reeder. A mixed-mode bending apparatus for delamination testing. NASA technical memorandum NAS 1.15:100662, NASA Langley Research Center, August 1988.
-
(1988)
NASA Technical Memorandum
-
-
Crews, J.H.1
Reeder, J.R.2
-
6
-
-
67650568174
-
Embedded wafer level ball grid array (ewlb)
-
T. Meyer. Embedded wafer level ball grid array (ewlb). In SEMICON Europa, 2007.
-
(2007)
Semicon Europa
-
-
Meyer, T.1
-
7
-
-
85087879410
-
Plane problems of cracks in dissimilar materials
-
J.R. Rice and G.C. Sih. Plane problems of cracks in dissimilar materials. Journal of Applied Mechanics, 32(2):418-423, 1965.
-
(1965)
Journal of Applied Mechanics
, vol.32
, Issue.2
, pp. 418-423
-
-
Rice, J.R.1
Sih, G.C.2
-
8
-
-
0005160499
-
Bruchvorhersagen bei überlagerter Normal-und Schubbeanspruchung von Rissen
-
H.A. Richard. Bruchvorhersagen bei überlagerter Normal-und Schubbeanspruchung von Rissen. VDI-Forschungsheft, 631/85:1-60, 1985.
-
(1985)
VDI-Forschungsheft
, vol.631
, Issue.85
, pp. 1-60
-
-
Richard, H.A.1
-
9
-
-
0017561766
-
FINITE ELEMENT CALCULATION OF STRESS INTENSITY FACTORS BY A MODIFIED CRACK CLOSURE INTEGRAL.
-
DOI 10.1016/0013-7944(77)90013-3
-
E.F. Rybicki and M.F. Kanninen. A finite element calculation of stress intensity factors by a modified crack closure integral. Engineering Fracture Mechanics, 9(4):931-938, 1977. (Pubitemid 9388160)
-
(1977)
Engineering Fracture Mechanics
, vol.9
, Issue.4
, pp. 931-938
-
-
Rybicki, E.F.1
Kanninen, M.F.2
-
10
-
-
4544322746
-
Chracterization and modelling of moisture driven interface failures
-
M.A.J. van Gils, P.J.J.H.A. Habets, G.Q. Zhang, W.D. van Driel, and P.J.G. Schreurs. Chracterization and modelling of moisture driven interface failures. Microelectronics Reliability, 44:1317-1322, 2004.
-
(2004)
Microelectronics Reliability
, vol.44
, pp. 1317-1322
-
-
Gils, M.A.J.V.1
Habets, P.J.J.H.A.2
Zhang, G.Q.3
Driel, W.D.V.4
Schreurs, P.J.G.5
-
11
-
-
0037198099
-
Micro- and nanomaterials characterization by image correlation methods
-
DOI 10.1016/S0924-4247(01)00908-6, PII S0924424701009086
-
D. Vogel, A. Gollhardt, and B. Michel. Micro-and nanomaterials characterization by image correlation methods. Sensors and Actuators A: Physical, Volume 99, Issues 1-2, 30:165-171, 2002. (Pubitemid 34690214)
-
(2002)
Sensors and Actuators, A: Physical
, vol.99
, Issue.1-2
, pp. 165-171
-
-
Vogel, D.1
Gollhardt, A.2
Michel, B.3
-
12
-
-
51349147247
-
Interfacial fracture properties and failure modeling for microelectronics
-
Orlando, FL
-
th Electronic Components and Technology Conference, ECTC, pages 1724-1730, Orlando, FL, 2008.
-
(2008)
th Electronic Components and Technology Conference, ECTC
, pp. 1724-1730
-
-
Xiao, A.1
Pape, H.2
Wunderle, B.3
Jansen, K.M.B.4
Ernst, L.J.5
|