On the accuracy of thermionic electron emission models. I. Electron detachment from SF6-

Journal of Chemical Physics

Volumn 130, Issue 24, 2009, Pages

  Troe, Jürgen ^a,b   Miller, Thomas M ^c   Viggiano, Albert A ^c  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE ENERGY; DETACHMENT RATE; EFFECTIVE TEMPERATURE; ELECTRON ATTACHMENT; ELECTRON CAPTURE THEORY; ELECTRON DETACHMENTS; ELECTRON ENERGIES; ELECTRON ENERGY DISTRIBUTIONS; EMITTED ELECTRON; FINE STRUCTURES; HEAT BATH; INTERNAL ENERGIES; KINETIC MODELING; SEMI-QUANTITATIVE; THERMAL DISTRIBUTIONS; THERMIONIC ELECTRON EMISSION; TOTAL ENERGY;

DISSOCIATION; ELECTRIC POWER DISTRIBUTION; ELECTRON ENERGY LEVELS; ELECTRONS; PHOTOLITHOGRAPHY; RATE CONSTANTS; THERMIONIC EMISSION;

ELECTRON AFFINITY;

ANION; SULFUR HEXAFLUORIDE;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; ELECTRON; KINETICS; TEMPERATURE;

ANIONS; ELECTRONS; KINETICS; MODELS, CHEMICAL; SULFUR HEXAFLUORIDE; TEMPERATURE;

EID: 67650496608     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3149782     Document Type: Article

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