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Volumn 50, Issue 5, 2009, Pages 1231-1234

Strain rate dependence on nanoindentation responses of interfacial intermetallic compounds in electronic solder joints with Cu and Ag substrates

Author keywords

Intermetallic compounds; Nanoindentation; Soldering; Strain rate sensitivity exponent (M)

Indexed keywords

AG SUBSTRATE; CU-BASED; ELECTRONIC SOLDERS; INTERFACIAL INTERMETALLICS; INTERMETALLIC COMPOUNDS; LOADING RATE; MECHANICAL BEHAVIOR; PB FREE SOLDERS; RATE SENSITIVE; SN-AG-CU; STRAIN RATE DEPENDENCE; STRAIN RATE SENSITIVITY EXPONENT (M);

EID: 67650478309     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.M2009016     Document Type: Conference Paper
Times cited : (37)

References (11)
  • 5
    • 0012489320 scopus 로고    scopus 로고
    • 2nd ed, Springer-Verlag, New York
    • C. Fisher-Cripps: Nanoindentation, 2nd ed., (Springer-Verlag, New York, 2004) p. 146.
    • (2004) Nanoindentation , pp. 146
    • Fisher-Cripps, C.1
  • 8
    • 67650370769 scopus 로고    scopus 로고
    • JCPDS no. 65-2303, no. 01-1240, no. 25-1228, no. 44-1300, no. 29-1155 and no. 26-0956. (International Center for Diffraction Data, Newton Square, PA)
    • JCPDS no. 65-2303, no. 01-1240, no. 25-1228, no. 44-1300, no. 29-1155 and no. 26-0956. (International Center for Diffraction Data, Newton Square, PA)
  • 9
    • 0001684266 scopus 로고
    • ed. by H. Kuhn and D. Medlin, Materials Park, OH, ASM international
    • J. L. Hay and G. M. Pharr: Instrumented indentation testing, ASM handbook, vol. 8, ed. by H. Kuhn and D. Medlin, (Materials Park, OH, ASM international, 1990) p. 232.
    • (1990) Instrumented indentation testing, ASM handbook , vol.8 , pp. 232
    • Hay, J.L.1    Pharr, G.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.