Preparation and characterization of thin films by plasma polymerization of glycidoxypropyltrimethoxysilane at different plasma powers and exposure times

Applied Surface Science

Volumn 255, Issue 20, 2009, Pages 8450-8457

  Sever, K ^a   Seki, Y ^a   Güleç, H Ali ^b,d   Sarikanat, M ^c   Mutlu, M ^d   Tavman, I ^a  

^a DOKUZ EYLUL UNIVERSITY   (Turkey)

^b YUZUNCU YIL UNIVERSITY   (Turkey)

^c EGE UNIVERSITY   (Turkey)

^d HACETTEPE UNIVERSITY   (Turkey)

Author keywords

Characterization; Contact angle measurement; Plasma polymerization; Polymeric films; X ray photo electron spectroscopy (XPS)

Indexed keywords

ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; CONTACT ANGLE; FILM PREPARATION; GLASS; POLYMER FILMS; SILICON COMPOUNDS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

FUNCTIONAL FILMS; GLASS SUBSTRATES; GLYCIDOXYPROPYLTRIMETHOXYSILANE; LOW-FREQUENCY PLASMAS; MORPHOLOGICAL CHANGES; PLASMA POLYMER FILMS; PLASMA POLYMERS; SURFACE CHARACTERISTICS;

PLASMA POLYMERIZATION;

EID: 67650475687     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.05.153     Document Type: Article

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