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Volumn 325, Issue 1-2, 1998, Pages 83-86

Preparation and characterization of thin films by plasma polymerization of hexamethyldisiloxane

Author keywords

Auger electron spectroscopy; Dielectric properties; Fourier transform infrared spectroscopy; Plasma processing and deposition

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CROSSLINKING; DIELECTRIC PROPERTIES OF SOLIDS; FILM PREPARATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PLASMA APPLICATIONS; POLYMERIZATION; THIN FILMS;

EID: 0032120530     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00492-1     Document Type: Article
Times cited : (40)

References (16)
  • 12
    • 0346330638 scopus 로고
    • Sigma Chemical Co., Inc., ed. 1, St. Louis, MO
    • R.J. Keller, The Sigma Library of FTIR Spectra, Sigma Chemical Co., Inc., ed. 1, St. Louis, MO, Vol. 2, 1986, p. 979.
    • (1986) The Sigma Library of FTIR Spectra , vol.2 , pp. 979
    • Keller, R.J.1
  • 15
    • 0004251816 scopus 로고
    • ASTM Special Technical Publication, Philadelphia, PA
    • R. Bartnikas, R.M. Eichhorn, Engineering Dielectrics, Volume IIA, ASTM Special Technical Publication, Philadelphia, PA, 1983.
    • (1983) Engineering Dielectrics , vol.2 A
    • Bartnikas, R.1    Eichhorn, R.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.