Influence of annealing temperature on microstructure and optical properties of sol-gel derived tungsten oxide films

Applied Surface Science

Volumn 255, Issue 20, 2009, Pages 8629-8633

  Sun, Xilian ^a   Cao, Hongtao ^a   Liu, Zhimin ^a   Li, Jianzhong ^a  

^a NINGBO INSTITUTE OF MATERIALS TECHNOLOGY AND ENGINEERING   (China)

Author keywords

Electrochromic thin films; Microstructure; Optical properties; Tungstic oxide

Indexed keywords

AMORPHOUS FILMS; ELECTROCHROMIC DEVICES; ELECTROCHROMISM; ELECTRON SCATTERING; MICROSTRUCTURE; OPTICAL PROPERTIES; OXALIC ACID; OXIDE FILMS; OXIDES; SOL-GEL PROCESS; SOL-GELS; SOUND INSULATING MATERIALS; THIN FILMS; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURES; ELECTROCHROMIC PROPERTIES; ELECTROCHROMICS; MONOCLINIC STRUCTURES; MORPHOLOGY EVOLUTION; PEROXOTUNGSTIC ACID; TUNGSTEN OXIDE FILMS; TUNGSTIC OXIDE;

OPTICAL FILMS;

EID: 67650456546     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.06.042     Document Type: Article

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