Robust process discovery with artificial negative events

Journal of Machine Learning Research

Volumn 10, Issue , 2009, Pages 1305-1340

  Goedertier, Stijn ^a   Martens, David ^a,b   Vanthienen, Jan ^a   Baesens, Bart ^a,c  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b UNIVERSITY COLLEGE GHENT   (Belgium)

^c UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

Graph pattern discovery; Inductive logic programming; Petri net; Positive data only; Process discovery

Indexed keywords

AUTOMATED CONSTRUCTION; CONFIGURABLE; GRAPH PATTERN DISCOVERY; INDUCTIVE BIAS; INDUCTIVE LOGIC PROGRAMMING; MACHINE LEARNING COMMUNITIES; NEGATIVE EXAMPLES; POSITIVE DATA ONLY; POSITIVE EXAMPLES; PRIOR KNOWLEDGE; PROBLEM FORMULATION; PROCESS DISCOVERY; STRUCTURED PROCESS;

GRAPH THEORY; LEARNING SYSTEMS; LOGIC PROGRAMMING; PETRI NETS; QUERY LANGUAGES; SECURITY OF DATA;

LEARNING ALGORITHMS;

EID: 67650447343     PISSN: 15324435     EISSN: 15337928     Source Type: Journal    
DOI: None     Document Type: Article

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