메뉴 건너뛰기




Volumn 11, Issue 6, 2009, Pages 452-458

Principles of highly resolved determination of texture and microstructure using high-energy synchrotron radiation

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION IMAGING; HARD X RAY; HIGH ENERGY; HIGH ORIENTATION; ORIENTATION STEREOLOGY; POLE DENSITY; POLYCRYSTALLINE AGGREGATES; TWO-DIMENSIONAL IMAGES;

EID: 67650441931     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.200800368     Document Type: Article
Times cited : (3)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.