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Volumn 11, Issue 6, 2009, Pages 452-458
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Principles of highly resolved determination of texture and microstructure using high-energy synchrotron radiation
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION IMAGING;
HARD X RAY;
HIGH ENERGY;
HIGH ORIENTATION;
ORIENTATION STEREOLOGY;
POLE DENSITY;
POLYCRYSTALLINE AGGREGATES;
TWO-DIMENSIONAL IMAGES;
ELECTROMAGNETIC WAVES;
GRAIN SIZE AND SHAPE;
SYNCHROTRON RADIATION;
SYNCHROTRONS;
TEXTURES;
POLYCRYSTALLINE MATERIALS;
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EID: 67650441931
PISSN: 14381656
EISSN: 15272648
Source Type: Journal
DOI: 10.1002/adem.200800368 Document Type: Article |
Times cited : (3)
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References (13)
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