Recrystallization texture and microstructure in Ni and AlMg1Mn1 determined with high-energy synchrotron radiation

Materials Science Forum

Volumn 467-470, Issue II, 2004, Pages 1379-1384

  Klein, H ^a   Preusser, A ^b   Bunge, H J ^b   Raue, L ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; CRYSTAL ORIENTATION; ELECTROMAGNETIC WAVE DIFFRACTION; POLYCRYSTALLINE MATERIALS; RECRYSTALLIZATION (METALLURGY); SYNCHROTRON RADIATION; TEXTURES;

GOSS-TEXTURES; ORIENTATION DISTRIBUTION FUNCTION (ODF); RECRYSTALLIZATION TEXTURES; SWEEPING DETECTORS;

NICKEL;

EID: 17144430525     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.467-470.1379     Document Type: Conference Paper

References (11)

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10. W. Bleck and H.J. Bunge. The Recrystallization of AlMnl Investigated by Pole Figures by Number. Acta Met. 29 (1991) 1401-1412.
11. H.J. Bunge, L. Wcislak, H. Klein, U. Garbe and J.R. Schneider. Texture and Microstructure Imaging in Six Dimensions with High-Energy Synchrotron Radiation. J. Appl. Cryst. 36 (2003) 1240-1255.