SCOPUS 정보 검색 플랫폼

Volumn 80, Issue 6, 2009, Pages

A compact electron beam ion source with integrated Wien filter providing mass and charge state separated beams of highly charged ions

(4) Schmidt, M a Peng, H b Zschornack, G c Sykora, S c

a DREEBIT GmbH (Germany)

b LANZHOU UNIVERSITY (China)

c DRESDEN UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM CURRENTS; BEAM LINES; CHARGE STATE; DIFFERENT SIZES; DRESDENS; ELECTRON BEAM ION SOURCE; HIGHLY CHARGED IONS; ION BEAM EXTRACTION; ROOM TEMPERATURE; WIEN FILTERS;

ELECTRIC CURRENT MEASUREMENT; ELECTRON BEAMS; ELECTRON TRAPS; ION SOURCES; ISOTOPES; KRYPTON; MAGNETIC DEVICES; PERMANENT MAGNETS; XENON;

IONS;

HYDROGEN; IODINE; ION; KRYPTON; XENON;

ALGORITHM; ARTICLE; CHEMISTRY; ELECTRON; EQUIPMENT DESIGN; INSTRUMENTATION; MAGNETISM; SPECTROSCOPY; TEMPERATURE;

ALGORITHMS; ELECTRONS; EQUIPMENT DESIGN; HYDROGEN; IODINE; IONS; KRYPTON; MAGNETICS; SPECTRUM ANALYSIS; TEMPERATURE; XENON;

EID: 67650333647 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3125628 Document Type: Article

Times cited : (33)

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