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Volumn 404, Issue 16, 2009, Pages 2419-2424
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Effects of processing on the electrical and structural properties of spray deposited CdS:In thin films
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Author keywords
Annealing; Cadmium sulfide; Etching; Semiconductors
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Indexed keywords
CADMIUM SULFIDE;
CDS;
ELECTRICAL AND STRUCTURAL PROPERTIES;
ELECTRICAL PROPERTY;
HEXAGONAL PHASE;
I - V CURVE;
NITROGEN ATMOSPHERES;
PHASE CHANGE;
POLYCRYSTALLINE;
SCANNING ELECTRON MICROSCOPE;
SCANNING ELECTRON MICROSCOPES;
SEM IMAGE;
SEMICONDUCTORS;
SPRAY-DEPOSITED;
SPRAY-PYROLYSIS TECHNIQUES;
SUBSTRATE TEMPERATURE;
XRD PATTERNS;
ANNEALING;
CADMIUM;
DIFFRACTION;
ELECTRIC PROPERTIES;
ETCHING;
MICROSCOPES;
SCANNING;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING CADMIUM COMPOUNDS;
SPRAY PYROLYSIS;
STRUCTURAL PROPERTIES;
THIN FILMS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
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EID: 67650111656
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2009.04.052 Document Type: Article |
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Times cited : (23)
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References (16)
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