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Volumn 607, Issue 1, 2009, Pages 120-122
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Surface processing of TlBr single crystals used for radiation detectors
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Author keywords
Luminescence; Microhardness; Radiation detector; TlBr
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Indexed keywords
BRIDGMAN-STOCKBARGER METHOD;
CHEMICAL ETCHING;
CRYSTAL QUALITIES;
DEFORMED SURFACE LAYERS;
DESTROYED SURFACE LAYER;
HIGH DENSITY;
HIGH QUALITY;
PROCESSING METHOD;
STRUCTURAL DEFECT;
STRUCTURE-SENSITIVE;
SURFACE LAYERS;
SURFACE PROCESSING;
TLBR;
VICKERS MICROHARDNESS;
CRYSTAL CUTTING;
CRYSTAL STRUCTURE;
DISLOCATIONS (CRYSTALS);
LUMINESCENCE;
MICROHARDNESS;
PROCESSING;
RADIATION DAMAGE;
RADIATION DETECTORS;
SURFACE DEFECTS;
SURFACES;
SINGLE CRYSTALS;
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EID: 67650104685
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2009.03.128 Document Type: Article |
Times cited : (9)
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References (18)
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