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Volumn 607, Issue 1, 2009, Pages 120-122

Surface processing of TlBr single crystals used for radiation detectors

Author keywords

Luminescence; Microhardness; Radiation detector; TlBr

Indexed keywords

BRIDGMAN-STOCKBARGER METHOD; CHEMICAL ETCHING; CRYSTAL QUALITIES; DEFORMED SURFACE LAYERS; DESTROYED SURFACE LAYER; HIGH DENSITY; HIGH QUALITY; PROCESSING METHOD; STRUCTURAL DEFECT; STRUCTURE-SENSITIVE; SURFACE LAYERS; SURFACE PROCESSING; TLBR; VICKERS MICROHARDNESS;

EID: 67650104685     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.03.128     Document Type: Article
Times cited : (9)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.