Annealing and characterisation of TlBr crystals for detector applications

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 546, Issue 1-2, 2005, Pages 200-204

  Kozlov, V ^a   Leskela M ^a   Sipila H ^b  

^a UNIVERSITY OF HELSINKI   (Finland)

^b Oxford Instruments Analytical Oy   (Finland)

Author keywords

Hydrothermal annealing; Photoconductivity; X ray detectors

Indexed keywords

ANNEALING; ARGON; CRYSTAL GROWTH; CRYSTALS; CURRENT VOLTAGE CHARACTERISTICS; DIFFRACTOMETERS; GAMMA RAYS; HYDROTHERMAL SYNTHESIS; PHOTOCONDUCTIVITY; WATER; X RAY POWDER DIFFRACTION; X RAYS;

HYDROTHERMAL ANNEALING; PHOTOCURRENT MEASUREMENTS; X-RAY DETECTORS; X-RAY POWDER DIFFRACTOMETERS;

THALLIUM COMPOUNDS;

EID: 20444501419     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.03.025     Document Type: Conference Paper

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