Automatic detection of in-field defect growth in image sensors

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2008, Pages 305-313

  Leung, Jenny ^a   Chapman, Glenn H ^a   Koren, Israel ^b   Koren, Zahava ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b University of Massachusetts   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC DETECTION; BAYESIAN STATISTICS; CAMERA SETTINGS; CCD IMAGERS; CELL PHONE CAMERA; COLOR IMAGES; DEFECT GROWTH; DEMOSAICING; DETECTION ACCURACY; DIGITAL IMAGE SENSORS; IMAGE SCENE; IMAGE SETS; IMAGERS; IN-FIELD; LOCAL CLUSTERING; PIXEL SIZE; SEQUENCE OF IMAGES; TEST RESULTS; TRACING ALGORITHM; VISUAL INSPECTION;

CHARGE COUPLED DEVICES; COSMOLOGY; DIGITAL CAMERAS; DIGITAL IMAGE STORAGE; FAULT TOLERANCE; FAULT TOLERANT COMPUTER SYSTEMS; IMAGE SENSORS; IONIZING RADIATION; PROBABILITY DENSITY FUNCTION; QUALITY ASSURANCE; VISUAL COMMUNICATION;

DEFECTS;

EID: 67649910836     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2008.58     Document Type: Conference Paper

References (4)

1. J. Leung, J. Dudas, G. H. Chapman, I. Koren, Z. Koren, "Quantitative Analysis of In-Field Defects in Image Sensor Arrays," Proc. of the 2007 Intern. Symposium on Defect and Fault Tolerance in VLSI, pp.526-534, Rome, Italy, Sept 2007.
2. A. J.P. Theuwissen, "Influence of Terrestrial Cosmic Rays on the Reliability of CCD Image Sensors," IEDM 2005, San Francisco, CA, 2005.
3. J. Leung, J. Dudas, G.H. Chapman, Z. Koren, and I. Koren, "Characterization of defect development During Digital Imager Lifetime," Proc. Electronic Imaging, Sensors, Cameras, and Systems for Industrial/Scientific Application IX, San Jose, Jan. 2008.
4. J. Dudas, L.M. Wu, C. Jung, G.H. Chapman, Z. Koren, and I. Koren, "Identification of in-field defect development in digital image sensors," Proc. Electronic Imaging, Digital Photography III, v6502, 65020Y1-0Y12, San Jose, Jan. 2007.