Quantitative analysis of in-field defects in image sensor arrays

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2007, Pages 526-534

  Leung, Jenny ^a   Dudas, Jozsef ^a   Chapman, Glenn H ^a   Koren, Israel ^b   Koren, Zahava ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b University of Massachusetts   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTICS OF DEFECT; CLOSEST DISTANCE; CONFIDENCE LEVELS; DEFECT CLUSTER; DEFECT CLUSTERING; ENVIRONMENTAL STRESS; MATERIAL DEGRADATION; STATISTICAL STUDY;

FAULT TOLERANCE; PIXELS;

DEFECTS;

EID: 43449085671     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2007.59     Document Type: Conference Paper

References (2)

1. A.J.P.Theuwissen, "Influence of Terrestrial Cosmic Rays on the Reliability of CCD Image Sensors," IEDM 2005, San Francisco, CA, 2005.
2. J.Dudas, L.M.Wu, C.Jung, G.H.Chapman, Z.Koren and I.Koren, "Identification of in-field defect development in digital image sensors," Proc.SPIE 6502, San Jose, CA, January 2007.