Influence of terrestrial cosmic rays on the reliability of CCD image sensors

Technical Digest - International Electron Devices Meeting, IEDM

Volumn 2005, Issue , 2005, Pages 811-814

  Theuwissen, Albert J P ^a  

^a NONE   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; COSMIC RAYS; IMAGE RESOLUTION; RADIATION EFFECTS;

CCD IMAGE SENSORS; SOLID STATE IMAGE SENSORS; TERRESTRIAL COSMIC RAYS;

IMAGE SENSORS;

EID: 33847738952     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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9. A.M. Chugg et.al. : "Single Particle Dark Current Spikes Induced in CCDs by High Energy Neutrons", IEEE Trans. Nuclear Science, Vol. 50, 2003, pp. 2011-2017.