Nanomechanical cantilever active probes for ultrasmall mass detection

Journal of Applied Physics

Volumn 105, Issue 1, 2009, Pages

  Salehi Khojin, Amin ^a   Bashash, Saeid ^a   Jalili, Nader ^a   Müller, Maren ^b   Berger, Rüdiger ^b  

^a AMRL   (United States)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE PROBE; ADDED MASS; EFFECT OF PARAMETERS; FOCUSED ION BEAM TECHNIQUE; GEOMETRICAL DISCONTINUITY; HIGH-AMPLITUDE VIBRATIONS; MASS DETECTION; MODE OF OPERATIONS; NANO-MECHANICAL CANTILEVER; PRECISE MEASUREMENTS; RESONANT FREQUENCIES; SYSTEM IDENTIFICATION PROCEDURE; SYSTEM IDENTIFICATIONS; TIP MASS; ULTRASMALL MASS;

ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; ION BEAMS; NANOCANTILEVERS; NATURAL FREQUENCIES; PARAMETER ESTIMATION; SENSITIVITY ANALYSIS; UNCERTAINTY ANALYSIS;

PROBES;

EID: 67649818404     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3054371     Document Type: Article

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