Effect of grain boundary on local surface conductivity of diamond film

Journal of Applied Physics

Volumn 105, Issue 1, 2009, Pages

  Li, Y L ^a   Li, J J ^a   Xia, X X ^a   Lu, C ^a   Jin, H ^a   Gu, C Z ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE PROBE; ELECTRICAL PROPERTY; ELECTRON TRANSPORT; EXPERIMENTAL EVIDENCE; HYDROGENATION DEGREE; LOCAL SURFACES; MICROWAVE PLASMA ENHANCED CHEMICAL VAPOR DEPOSITIONS; SEM; TIP RADIUS;

DIAMOND CUTTING TOOLS; DIAMONDS; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HYDROGENATION; MICROWAVES; PLASMA DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PROBES; SCANNING ELECTRON MICROSCOPY; SURFACE DEFECTS;

DIAMOND FILMS;

EID: 67649755667     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3056381     Document Type: Article

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