Mean free path limitation of thermoelectric properties of bismuth nanowire

Journal of Applied Physics

Volumn 105, Issue 11, 2009, Pages

  Murata, Masayuki ^a   Nakamura, Daiki ^a   Hasegawa, Yasuhiro ^a   Komine, Takashi ^b   Taguchi, Takashi ^c   Nakamura, Shinichiro ^c   Jaworski, Christopher M ^d   Jovovic, Vladimir ^d   Heremans, Joseph P ^d  

^a SAITAMA UNIVERSITY   (Japan)

^b IBARAKI UNIVERSITY   (Japan)

^c DENSO CORPORATION   (Japan)

^d The Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH NANOWIRES; BULK SAMPLES; EXPERIMENTAL COMPARISON; MEAN FREE PATH; MICROWIRE; TEMPERATURE COEFFICIENT; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENCIES; THERMOELECTRIC PROPERTIES; THIN WIRES; WIRE DIAMETER;

EVAPORATIVE COOLING SYSTEMS; HOLE MOBILITY; NANOWIRES; SEEBECK COEFFICIENT; WIRE;

BISMUTH;

EID: 67649563150     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3131842     Document Type: Article

References (30)

1. L. D. Hicks and M. S. Dresselhaus, Phys. Rev. B 0163-1829 47, 12727 (1993). 10.1103/PhysRevB.47.12727
2. T. C. Harman, P. J. Taylor, M. P. Walsh, and B. E. LaForge, Science 0036-8075 297, 2229 (2002). 10.1126/science.1072886
3. R. Venkatasubramanian, E. Siivola, T. Colpitts, and B. O'Quinn, Nature (London) 0028-0836 413, 597 (2001). 10.1038/35098012
4. K. Liu, C. L. Chein, P. C. Searson, and K. Yu-Zhang, Appl. Phys. Lett. 0003-6951 73, 1436 (1998). 10.1063/1.122378
5. K. Hong, F. Y. Yang, K. Liu, D. H. Reich, P. C. Searson, C. L. Chien, F. F. Balakirev, and G. S. Boebinger, J. Appl. Phys. 0021-8979 85, 6184 (1999). 10.1063/1.370215
6. J. Heremans and C. M. Thrush, Phys. Rev. B 0163-1829 59, 12579 (1999). 10.1103/PhysRevB.59.12579
7. J. Heremans, C. M. Thrush, Y. M. Lin, S. Cronin, Z. Zhang, M. S. Dresselhaus, and J. F. Mansfield, Phys. Rev. B 0163-1829 61, 2921 (2000). 10.1103/PhysRevB.61.2921
8. T. W. Cornelius, M. E. Toimil-Molares, R. Neumann, and S. Karim, J. Appl. Phys. 0021-8979 100, 114307 (2006). 10.1063/1.2388857
9. A. Nikolaeva, T. E. Huber, D. Gitsu, and L. Konopko, Phys. Rev. B 0163-1829 77, 035422 (2008). 10.1103/PhysRevB.77.035422
10. Y. Hasegawa, Y. Ishikawa, T. Komine, T. E. Huber, A. Suzuki, H. Morita, and H. Shirai, Appl. Phys. Lett. 0003-6951 85, 917 (2004). 10.1063/1.1781390
11. Y. Hasegawa, Y. Ishikawa, H. Morita, T. Komine, H. Shirai, and H. Nakamura, J. Appl. Phys. 0021-8979 97, 083907 (2005). 10.1063/1.1865342
12. Y. Hasegawa, H. Nakano, H. Morita, A. Kurokouchi, K. Wada, T. Komine, and H. Nakamura, J. Appl. Phys. 0021-8979 101, 033704 (2007). 10.1063/1.2432876
13. Y. Hasegawa, H. Nakano, H. Morita, T. Komine, H. Okumura, and H. Nakamura, J. Appl. Phys. 0021-8979 102, 073701 (2007). 10.1063/1.2785003
14. H. Iwasaki, H. Morita, and Y. Hasegawa, Jpn. J. Appl. Phys. 0021-4922 47, 3576 (2008). 10.1143/JJAP.47.3576
15. Y. Hasegawa, H. Morita, T. Komine, T. Taguchi, and S. Nakamura, J. Electron. Mater. 0361-5235 (in press).
16. Y. Hasegawa, M. Murata, D. Nakamura, T. Komine, T. Taguchi, and S. Nakamura, J. Appl. Phys. 0021-8979 (in press).
17. M. Murata, D. Nakamura, Y. Hasegawa, T. Komine, T. Taguchi, S. Nakamura, V. Jovovic, and J. P. Heremans, Appl. Phys. Lett. 0003-6951 94, 192104 (2009). 10.1063/1.3133355
18. D. L. Partin, J. Heremans, D. T. Morelli, C. M. Thrush, C. H. Olk, and T. A. Perry, Phys. Rev. B 0163-1829 38, 3818 (1988). 10.1103/PhysRevB.38.3818
19. Y. -M. Lin, S. B. Cronin, J. Y. Ying, M. S. Dresselhaus, and J. P. Heremans, Appl. Phys. Lett. 0003-6951 76, 3944 (2000). 10.1063/1.126829
20. T. Teramoto, T. Komine, S. Yamamoto, M. Kuraishi, R. Sugita, Y. Hasegwa, and H. Nakamura, J. Appl. Phys. 0021-8979 104, 053714 (2008). 10.1063/1.2975387
21. Y. Hasegawa, T. Komine, Y. Ishikawa, A. Suzuki, and H. Shirai, Jpn. J. Appl. Phys., Part 1 0021-4922 43, 35 (2004). 10.1143/JJAP.43.35
22. J. P. Michenaud and J. P. Issi, J. Phys. C 0022-3719 5, 3061 (1972). 10.1088/0022-3719/5/21/011
23. R. B. Dingle, Proc. R. Soc. London, Ser. A 0950-1207 201, 545 (1950). 10.1098/rspa.1950.0077
24. J. M. Ziman, Electrons and Phonons (Oxford University Press, New York, 1958), p. 466.
25. C. F. Gallo, B. S. Chandrasekhar, and P. H. Sutter, J. Appl. Phys. 0021-8979 34, 144 (1963). 10.1063/1.1729056
26. Y. Hasegawa, Y. Ishikawa, T. Saso, H. Shirai, H. Morita, T. Komine, and H. Nakamura, Physica B 0921-4526 382, 140 (2006). 10.1016/j.physb.2006.02.011
27. S. B. Cronin, Y. -M. Lin, O. Rabin, M. R. Black, J. Y. Ying, M. S. Dresselhaus, P. L. Gai, J. -P. Minet, and J. -P. Issi, Nanotechnology 0957-4484 13, 653 (2002). 10.1088/0957-4484/13/5/322
28. A. Suzuki, Y. Hasegawa, Y. Ishikawa, T. Komine, H. Morita, and H. Shirai, Rev. Sci. Instrum. 0034-6748 76, 023907 (2005). 10.1063/1.1844691
29. Y. Hasegawa, Y. Ishikawa, H. Shirai, H. Morita, A. Kurokouchi, K. Wada, T. Komine, and H. Nakamura, Rev. Sci. Instrum. 0034-6748 76, 113902 (2005). 10.1063/1.2126952
30. J. P. Heremans, C. M. Thrush, D. T. Morelli, and M. -C. Wu, Phys. Rev. Lett. 0031-9007 88, 216801 (2002). 10.1103/PhysRevLett.88.216801