Surface and physical characteristics of ZnO:Al nanostructured films

Journal of Applied Physics

Volumn 105, Issue 11, 2009, Pages

  Fang, Te Hua ^a,b   Kang, Shao Hui ^a  

^a NATIONAL FORMOSA UNIVERSITY   (Taiwan)

^b NONE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; BUCKLING BEHAVIORS; FRACTURE STRENGTHS; INDENTATION DEPTH; INDENTATION PROCESS; NANO-INDENTATION MEASUREMENTS; NANOSTRUCTURED FILMS; PEIERLS DISTORTION; PER UNIT; PHASE TRANSFORMATION; PHYSICAL CHARACTERISTICS; PIEZOELECTRIC CHARACTERISTICS; POWER DENSITIES; ROCK-SALT STRUCTURE; SCANNING ELECTRON MICROSCOPE; STRUCTURAL AND SURFACE CHARACTERIZATION; WURTZITE STRUCTURE; YOUNG'S MODULUS; ZINC BLENDE; ZNO; ZNO NANOROD;

ALUMINUM; CONTACT ANGLE; MICROSCOPES; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SURFACE CHEMISTRY; ZINC; ZINC OXIDE; ZINC SULFIDE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 67649541306     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3133217     Document Type: Article

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