SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 105, Issue 11, 2009, Pages

Young's modulus of pulsed-laser deposited V6O13 thin films

(4) Rúa, Armando a Fernández, F́lix E a Cabrera, Rafmag a Sepúlveda, Nelson a

a UNIVERSITY OF PUERTO RICO (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE MATERIALS; EXPERIMENTAL ERRORS; FUNDAMENTAL RESONANT FREQUENCIES; INSULATOR TO METAL; LASER DEFLECTION; LOW TEMPERATURES; MICRO-CANTILEVERS; MIXED VALENCE; RESISTIVITY MEASUREMENT; RESONANT FREQUENCIES; SEMICONDUCTOR TRANSITION; SILICON DIOXIDE; THIN FILM BATTERY; VANADIUM OXIDES; YOUNG'S MODULUS;

ATOMIC FORCE MICROSCOPY; CATHODES; ELASTIC MODULI; ELASTICITY; LASERS; MECHANICAL PROPERTIES; METAL INSULATOR TRANSITION; NATURAL FREQUENCIES; PULSED LASER DEPOSITION; SILICA; THIN FILMS; VANADIUM; VANADIUM COMPOUNDS;

SEMICONDUCTOR LASERS;

EID: 67649498079 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3137191 Document Type: Article

Times cited : (16)

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