A simulative measuring model of scanning near-field optical microscope by applying aluminum atoms of FCC structure for the nano-scale standard sample and the qualitative analysis

Journal of the Chinese Society of Mechanical Engineers, Transactions of the Chinese Institute of Engineers, Series C/Chung-Kuo Chi Hsueh Kung Ch'eng Hsuebo Pao

Volumn 30, Issue 1, 2009, Pages 1-6

  Lin, Zone Ching ^a   Chou, Ming Ho ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Edge effect; Measuring model; Morse potential; Near field scanning optical microscope (SNOM)

Indexed keywords

ALUMINUM ATOMS; ATOMIC INTERACTIONS; ATOMIC MODELS; EDGE EFFECT; FCC STRUCTURES; FIXED AMPLITUDE; MEASURING MODEL; MORSE POTENTIAL; MORSE POTENTIALS; NANO SCALE; NEAR FIELD SCANNING OPTICAL MICROSCOPE (SNOM); QUALITATIVE ANALYSIS; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SIMULATIVE MODELS; STANDARD SAMPLES; VIBRATION THEORY;

ALUMINA; ALUMINUM; ATOMS; MICROSCOPES; NANOSTRUCTURED MATERIALS; OPTICAL FIBERS; ROADS AND STREETS;

SCANNING;

EID: 67649435905     PISSN: 02579731     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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