Application of RTDF to particles with curved surfaces

Journal of Quantitative Spectroscopy and Radiative Transfer

Volumn 110, Issue 14-16, 2009, Pages 1599-1603

  Hesse, E ^a   Mc Call, D S ^a   Ulanowski, Z ^a   Stopford, C ^a   Kaye, P H ^a  

^a UNIVERSITY OF HERTFORDSHIRE   (United Kingdom)

Author keywords

Diffraction on facets; Ray tracing

Indexed keywords

CURVED SURFACES; ICE CRYSTALS; PARTICLE SHAPE; ROUNDED EDGE; SIZE PARAMETERS; T-MATRIX;

DIFFRACTION; ELEMENTARY PARTICLE SOURCES;

LIGHT;

DIFFRACTION; GEOMETRY; ICE CRYSTAL; LIGHT SCATTERING; MATRIX; PARAMETERIZATION; PARTICLE SIZE; RAY TRACING; SIZE DISTRIBUTION;

EID: 67649343167     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jqsrt.2009.01.011     Document Type: Article

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