Electrical properties of nanostructured tin oxide surfaces produced by thermal treatments

Journal of Nanoscience and Nanotechnology

Volumn 9, Issue 3, 2009, Pages 1772-1777

  Maestre, D ^a   Cremades, A ^a   Gregoratti, L ^b   Heiderhoff, R ^c   Balk, L J ^c   Piqueras, J ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^b SINCROTRONE TRIESTE   (Italy)

^c UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

Scanning probe microscopy; Thermal treatment; Tin oxide

Indexed keywords

BAND GAPS; ELECTRICAL PROPERTY; LOWER ENERGIES; NANOSTRUCTURED SURFACE; NANOSTRUCTURED TIN OXIDES; OXYGEN ATMOSPHERE; POLYCRYSTALLINE SAMPLES; SCANNING SPREADING RESISTANCE MICROSCOPY; SCANNING TUNNELLING MICROSCOPY AND SPECTROSCOPY; THERMAL TREATMENT;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; ENERGY GAP; GRAIN BOUNDARIES; OXYGEN; PROBES; SCANNING TUNNELING MICROSCOPY; SINTERING; SPACE PROBES; TIN; X RAY PHOTOELECTRON SPECTROSCOPY;

SCANNING;

EID: 67649222906     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2009.385     Document Type: Conference Paper

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