Large format x-ray imager with mega-frame readout capability for XFEL, based on the DEPFET active pixel sensor

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2008, Pages 1578-1586

  Porro, Matteo ^a,b   Andricek, Ladislav ^b,d   Castoldi, Andrea ^e,f   Fiorini, Carlo ^e,f   Fischer, Peter ^g   Graafsma, Heinz ⁱ   Hansen, Karsten ⁱ   Kugel, Andreas ^g   Lutz, Gerhard ^b,c   Pietsch, Ullrich ^h   Re, Valerio ^j   Strüder, Lothar ^a,b  

^a MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^b MPI HALBLEITERLABOR   (Germany)

^c PNSENSOR GMBH   (Germany)

^d MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

^e POLITECNICO DI MILANO   (Italy)

^f INFN SEZIONE DI MILANO   (Italy)

^g UNIVERSITY OF HEIDELBERG   (Germany)

^h UNIVERSITY OF SIEGEN   (Germany)

ⁱ DESY   (Germany)

^j UNIVERSITY OF BERGAMO   (Italy)

more..

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE PIXEL SENSOR; CMOS TECHNOLOGY; DETECTOR CHIPS; DETECTOR SIGNALS; DETECTOR SYSTEMS; DIGITAL DATA; DYNAMIC RANGE; DYNAMIC RANGE COMPRESSION; FOCAL PLANE; FRAME RATE; HIGH DYNAMIC RANGE; HIGH-ENERGY RESOLUTION; LARGE FORMAT; LOW ENERGY PHOTONS; MATRIX; MEGA-FRAME; MIXED SIGNAL; NONLINEAR CHARACTERISTICS; OUTPUT SIGNAL; PIXEL SENSORS; PIXEL SIZE; SENSOR LEVEL; SIGNAL CHARGE; SINGLE PHOTONS; TIME GAP; X-RAY IMAGE; X-RAY IMAGER;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; DETECTORS; IMAGE SENSORS; PHOTONS; X RAY ANALYSIS;

PIXELS;

EID: 67649217076     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2008.4774711     Document Type: Conference Paper

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