Spectroscopic performance of the DePMOS detector/amplifier device with respect to different filtering techniques and operating conditions

IEEE Transactions on Nuclear Science

Volumn 53, Issue 1, 2006, Pages 401-408

  Porro, M ^a,b,c   Ferrari, G ^a,b   Fischer, P ^d   Halker O ^e   Harter, M ^d   Herrmann, S ^e   Hornel N ^f   Kohrs, R ^g   Krueger, H ^g   Lechner, P ^h   Lutz, G ^f   Peric, I ^d   Richter, R H ^f   Struder L ^e   Treis, J ^e   Trimpl, M ^g   Wermes, N ^g  

^a IEEE   (Italy)

^b POLITECNICO DI MILANO   (Italy)

^c INFN SEZIONE DI MILANO   (Italy)

^d UNIVERSITY OF MANNHEIM   (Germany)

^e MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^f MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

^g UNIVERSITY OF BONN   (Germany)

^h PNSENSOR GMBH   (Germany)

Author keywords

Active pixel sensor (APS); DePMOS; Noise filtering, readout electronics; X ray detector; X ray Evolving Universe Spectroscopy (XEUS); X ray spectroscopy

Indexed keywords

ACTIVE PIXEL SENSOR (APS); DEPMOS; NOISE FILTERING, READOUT ELECTRONICS; X-RAY DETECTOR; X-RAY EVOLVING UNIVERSE SPECTROSCOPY (XEUS);

AMPLIFIERS (ELECTRONIC); CAPACITANCE; ELECTRONIC EQUIPMENT; ELECTRONS; SENSORS; WAVE FILTERS; X RAY SPECTROSCOPY;

MOS DEVICES;

EID: 33645670804     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.869850     Document Type: Article

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