Surface-enhanced Raman scattering on periodic metal nanotips with tunable sharpness

Nanotechnology

Volumn 20, Issue 22, 2009, Pages

  Linn, Nicholas C ^a   Sun, Chih Hung ^a   Arya, Ajay ^a   Jiang, Peng ^a   Jiang, Bin ^b  

^a University of Florida   (United States)

^b PORTLAND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITED METAL; ELECTROMAGNETIC MODELING; ENHANCEMENT FACTOR; FINITE-ELEMENT; NANO SCALE; NANOPYRAMIDS; PACKED COLLOIDAL CRYSTALS; PYRAMIDAL PITS; RAMAN ENHANCEMENT; SERS ENHANCEMENT; SERS-ACTIVE SUBSTRATES; SHARP TIP; STRUCTURAL TEMPLATES; SURFACE-ENHANCED RAMAN SCATTERING; TEMPLATED; THIN LAYERS;

ELECTROMAGNETIC FIELDS; GOLD DEPOSITS; NANOTIPS; RAMAN SCATTERING; SURFACES;

SUBSTRATES;

GOLD; METAL NANOPARTICLE; POLYMER; NANOMATERIAL; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; COLLOID; CONTROLLED STUDY; CRYSTAL; ELECTROMAGNETIC FIELD; EXPERIMENTAL MODEL; NANOANALYSIS; NANOTIP; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; SURFACE ENHANCED RAMAN SCATTERING; THICKNESS; ALGORITHM; CHEMISTRY; COMPUTER SIMULATION; FINITE ELEMENT ANALYSIS; METHODOLOGY; SURFACE PROPERTY; THEORETICAL MODEL; ULTRASTRUCTURE;

ALGORITHMS; COMPUTER SIMULATION; ELECTROMAGNETIC PHENOMENA; FINITE ELEMENT ANALYSIS; GOLD; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; MODELS, THEORETICAL; NANOSTRUCTURES; SILICON; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 67649188233     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/22/225303     Document Type: Article

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