Temperature dependent Raman scattering in polycrystalline Bi 4Ti3O12 thin films

Solid State Communications

Volumn 131, Issue 5, 2004, Pages 313-317

  Du, Y L ^a   Chen, G ^a   Zhang, M S ^b  

^a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b NANJING UNIVERSITY   (China)

Author keywords

A. Thin films; B. Laser processing; D. Phase transitions; D. Phonons

Indexed keywords

CRYSTAL STRUCTURE; LASER BEAM EFFECTS; PHASE TRANSITIONS; PHONONS; RAMAN SCATTERING; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

LASER PROCESSING; MONOCLINIC DISTORTION; ORTHORHOMBIC STRUCTURE; RAMAN BANDS;

POLYCRYSTALLINE MATERIALS;

EID: 3042750019     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.05.026     Document Type: Article

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