On the fault diagnosis in the presence of unknown fault models using pass/fail information

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2005, Pages 2987-2990

  Takamatsu, Yuzo ^a   Seiyama, Tetsuya ^a   Takahashi, Hiroshi ^a   Higami, Yoshinobu ^a   Yamazaki, Koji ^b  

^a EHIME UNIVERSITY   (Japan)

^b MEIJI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT UNDER TEST; DIAGNOSTIC METHODS; FAULT DIAGNOSIS; FAULT MODEL; FAULTY CIRCUITS; FAULTY CONDITION; FEATURE SIZES; LOGIC VALUES; OPEN FAULTS; PRIMARY OUTPUTS; SINGLE STUCK-AT FAULTS; STUCK-AT FAULTS;

BUILT-IN SELF TEST; COMBINATORIAL CIRCUITS; QUALITY ASSURANCE; RANDOM ACCESS STORAGE; SAFETY FACTOR;

FAILURE ANALYSIS;

EID: 67649124674     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2005.1465255     Document Type: Conference Paper

References (6)

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