Characterization of ragweed pollen adhesion to polyamides and polystyrene using atomic force microscopy

Environmental Science and Technology

Volumn 43, Issue 12, 2009, Pages 4308-4313

  Thio, Beng Joo Reginald ^a   Lee, Jung Hyun ^a   Meredith, J Carson ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCES; AFM CANTILEVERS; CONTROL SURFACES; MOLECULAR ATTRACTION; NYLON-6; POLLEN ADHESION; POLLEN GRAINS; POLY-AMIDE 12; POLYMER SURFACES; RAGWEED POLLEN; RELATIVE HUMIDITIES;

AMIDES; AMINO ACIDS; ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; ATOMS; HUMIDITY CONTROL; MOISTURE; NYLON POLYMERS; POLYMER BLENDS; POLYSTYRENES; RAYON; VAN DER WAALS FORCES;

ADHESION;

POLYAMIDE; POLYSTYRENE; SILICON;

ADHESION; ASTHMA; ATOMIC FORCE MICROSCOPY; DICOTYLEDON; HUMIDITY; MOLECULAR ANALYSIS; POLLEN; POLYMER; SILICON;

AIR QUALITY; ARTICLE; ATOMIC FORCE MICROSCOPY; HUMIDITY; MEASUREMENT; MOLECULE; RAGWEED; RAGWEED POLLEN;

AMBROSIA; ENVIRONMENTAL MONITORING; MICROSCOPY, ATOMIC FORCE; NYLONS; POLLEN; POLYSTYRENES; SURFACE PROPERTIES;

AMBROSIA; AMBROSIA ARTEMISIIFOLIA;

EID: 67449149930     PISSN: 0013936X     EISSN: 15205851     Source Type: Journal    
DOI: 10.1021/es803422s     Document Type: Article

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