Nitrogen effect on corrosion resistance of ion beam sputtered nanocrystalline zirconium nitride films

Surface and Coatings Technology

Volumn 203, Issue 17-18, 2009, Pages 2591-2594

  Larijani, M M ^a   Elmi, M ^b   Yari, M ^c   Ghoranneviss, M ^c   Balashabadi, P ^a   Shokouhy, A ^c  

^a AGRICULTURAL MEDICAL AND INDUSTRIAL RESEARCH SCHOOL   (Iran)

^b ISLAMIC AZAD UNIVERSITY   (Iran)

^c ISLAMIC AZAD UNIVERSITY   (Iran)

Author keywords

Corrosion; Potentiodynamic; Thickness; XRD; ZrN

Indexed keywords

AISI STAINLESS STEELS; ANTICORROSIVE PROPERTIES; CORROSIVE AGENTS; CRYSTALLINE ORIENTATIONS; ELECTROCHEMICAL TESTS; FLOW RATE RATIOS; ION-BEAM SPUTTERING; NANO-CRYSTALLINE; NITROGEN EFFECTS; POTENTIODYNAMIC; PREFERRED ORIENTATIONS; SAMPLE SURFACES; SEM; THICKNESS; THICKNESS OF THE FILMS; X-RAY DIFFRACTIONS; XRD; ZIRCONIUM NITRIDES; ZR N FILMS; ZRN;

CORROSION PROTECTION; FLOW RATE; ION BEAMS; NITRIDES; SCANNING ELECTRON MICROSCOPY; SPUTTERING; STAINLESS STEEL; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

CORROSION RESISTANCE;

EID: 67349248407     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2009.02.064     Document Type: Article

References (9)

1. Sue J.A., and Charge T.P. Surface and Coatings Technology 76/77 (1995) 61
2. Kelesoglu E., Mittere C., Kazmanli M.K., and Urgen M. Surface and Coatings Technology 116-119 (1999) 133
3. Igarashi Y., Yamaji T., and Nishikawa S. Japanese Journal of Applied Physics 29 (1990) L2337
4. Wiiala U.K., Penttinen I.M., and Korhonen A.S. Surface and Coatings Technology 108/109 (1998) 230
5. van Leaven L., Alias M.N., and Brown R. Surface and Coatings Technology, 53 (1992) 25
6. Beck U., Reiners G., Urban I., Jehn H.A., Kopacz U., and Sahack H. Surface and Coatings Technology 61 (1993) 215
7. Larijani M.M., Tabrizi N., Norouzian Sh., Jafari A., Lahouti S., Haj Hosseini H., and Afshari N. Vacuum 81 (2006) 550
8. In: Kaeble E.F. (Ed). Handbook of X-rays (1967), McGraw-Hill, New York Part2, Chapter17
9. Chou W.-J., Yu G.-P., and Huang J.H. Thin Solid Films 405 (2002) 162