Measurements of the complex transmission/reflection coefficient of a material using mixed-type common-path heterodyne interferometery

IEEE Transactions on Instrumentation and Measurement

Volumn 58, Issue 6, 2009, Pages 1878-1885

  Chieh, J J ^a   Yang, S Y ^a   Horng, Herng Er ^a   Hong, Chin Yih ^b   Yang, H C ^c  

^a NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

^b NAN KAI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Common path; Complex reflection coefficient; Complex transmission coefficient; Heterodyne interferometer; Optical characterization

Indexed keywords

COMMON PATH; COMPLEX REFLECTION COEFFICIENT; COMPLEX TRANSMISSION COEFFICIENT; HETERODYNE INTERFEROMETER; OPTICAL CHARACTERIZATION;

CAPILLARITY; CERAMIC CAPACITORS; DIELECTRIC WAVEGUIDES; HETERODYNING; INTERFEROMETRY; LIGHT; LIGHT REFRACTION; LIGHT SOURCES; MAGNETIC PERMEABILITY; OPTICAL VARIABLES CONTROL; OXIDE MINERALS; PERMANENT MAGNETS; PERMITTIVITY; QUARTZ; REFLECTION; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTOR QUANTUM DOTS;

INTERFEROMETERS;

EID: 67349247457     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.2005812     Document Type: Conference Paper

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