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Volumn 93, Issue 8, 2009, Pages 1435-1439

Silicon nitride passivated bifacial Cz-silicon solar cells

Author keywords

Bifacial; PECVD; Silicon nitride; Surface passivation

Indexed keywords

BACK SURFACE FIELDS; BASE MATERIAL; BIFACIAL; HIGHER EFFICIENCY; INDUSTRIAL PRODUCTION; LOW RESISTIVITY; NEW PROCESS; PECVD; REAR SURFACES; SCREEN-PRINTED; SURFACE PASSIVATION;

EID: 67349220717     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2009.03.015     Document Type: Article
Times cited : (22)

References (12)
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    • J.M. Gee, A simple procedure to analyze rear-surface internal quantum efficiency, in: Conference Record of the 25th IEEE Photovoltaic Specialists Conference, May 1996, pp. 557-560, doi: 10.1109/PVSC.1996.564067.
  • 6
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    • Basore, P.A.1    Clugston, D.A.2
  • 7
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  • 8
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    • (2003)
    • Fischer, B.1
  • 9
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  • 10
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    • Experimental evidence of parasitic shunting in silicon nitride rear surface passivated solar cells
    • 10.1002/pip.420
    • Dauwe S., Mittelstädt L., Metz A., and Hezel R. Experimental evidence of parasitic shunting in silicon nitride rear surface passivated solar cells. Progress in Photovoltaics: Research and Applications 10 4 (2002) 271-278 10.1002/pip.420
    • (2002) Progress in Photovoltaics: Research and Applications , vol.10 , Issue.4 , pp. 271-278
    • Dauwe, S.1    Mittelstädt, L.2    Metz, A.3    Hezel, R.4
  • 11
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    • S. Dauwe, J. Schmidt, A. Metz, R. Hezel, Fixed charge density in silicon nitride films on crystalline silicon surfaces under illumination, in: Conference Record of the 29th IEEE Photovoltaic Specialists Conference, May 2002, pp. 162-165.
    • S. Dauwe, J. Schmidt, A. Metz, R. Hezel, Fixed charge density in silicon nitride films on crystalline silicon surfaces under illumination, in: Conference Record of the 29th IEEE Photovoltaic Specialists Conference, May 2002, pp. 162-165.
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    • Investigation of charge carrier injection in silicon nitride/silicon junctions
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    • Elmiger, J.R.1    Kunst, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.