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Volumn 93, Issue 6-7, 2009, Pages 888-892

Study of the effect of annealing process on the performance of P3HT/PCBM photovoltaic devices using scanning-probe microscopy

Author keywords

Anneal process; Atomic force microscopy; Photovoltaic; Scanning near field microscopy

Indexed keywords

ANNEAL PROCESS; ANNEALING PROCESS; ATOMIC-FORCE MICROSCOPIES; BULK HETEROJUNCTIONS; BUTYRIC ACIDS; CHARGE TRANSPORTS; COMPOSITION DISTRIBUTIONS; DEVICE EFFICIENCIES; METHYL ESTERS; MORPHOLOGY EVOLUTIONS; NEAR-FIELD MICROSCOPIES; ORDERED STRUCTURES; PHOTOVOLTAIC; PHOTOVOLTAIC DEVICES; POLY (3-HEXYLTHIOPHENE); SCANNING NEAR-FIELD MICROSCOPY; SCANNING-PROBE MICROSCOPIES;

EID: 67349218396     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2008.10.027     Document Type: Article
Times cited : (109)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.